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  Scopus ID: 21100926589

Magnetic Force Microscopy for Nanoparticle Characterization

Gustavo Cordova, Brenda Yasie Lee and Zoya Leonenko


Since the invention of the atomic force microscope (AFM) in 1986, there has been a drive to apply this scanning probe technique or a form of this technique to various disciplines in nanoscale science. Magnetic force microscopy (MFM) is a member of a growing family of scanning probe methods and has been widely used for the study of magnetic materials. In MFM a magnetic probe is used to raster-scan the surface of the sample, of which its magnetic field interacts with the magnetic tip to offer insight into its magnetic properties. This review will focus on the use of MFM in relation to nanoparticle characterization, including superparamagnetic iron oxide nanoparticles, covering MFM imaging in air and in liquid environments.

Published on: April 28, 2016
doi: 10.17756/nwj.2016-022
Citation:  Cordova G, Lee BY, Leonenko Z. 2016. Magnetic Force Microscopy for Nanoparticle Characterization. NanoWorld J 2(1): 10-14.