<citation>
<author-group>
<name>
<surname>Kathiresan</surname>
<given-names>L</given-names>
</name>
<name>
<surname>Buenaño</surname>
<given-names>L</given-names>
</name>
<name>
<surname>Bonilla</surname>
<given-names>S</given-names>
</name>
<name>
<surname>Ajila</surname>
<given-names>F</given-names>
</name>
<name>
<surname>Valverde</surname>
<given-names>V</given-names>
</name>
</author-group>
<year>2023</year>
<article-title>Revolutionizing Nanomaterial Defect Detection with Deep Learning Algorithms</article-title>
<source>NanoWorld J</source>
<volume>9</volume>
<issue>S3</issue>
<fpage>S973</fpage>
<lpage>S979</lpage>
</citation>